Thursday, 27 June, 2013

Organic electronics

Imaging defects in solar cells

 

Grafik: Christian Westermeier

Researchers at LMU have developed a new method for visualizing material defects in thin-film solar cells.

An LMU research team led by Bert Nickel has, for the first time, succeeded in functionally characterizing the active layer in organic thin-film solar cells using laser light for localized excitation of the material. The findings are reported in the scientific journal Advanced Materials. We have developed a method in which the material is raster-scanned with a laser, while the focused beam is modulated in different ways, by means of a rotating attenuator for instance. This enables us to map directly the spatial distribution of defects in organic thin films, a feat which has not previously been achieved, explains Christian Westermeier, who is first author of the new study. more...

Pressemitteilung der LMU (deutsch)
Publication "Mapping of Trap Densities and Hotspots in Pentacene Thin-Film Transistors by Frequency-Resolved Scanning Photoresponse Microscopy"